40min:
SPECTROSCOPY AND DYNAMICS OF SEMICONDUCTOR GROWTH INTERMEDIATES.

DENNIS J. CLOUTHIER, Department of Chemistry, University of Kentucky, Lexington KY 40506-0055.

Gas phase reactive intermediates play an important role in various semiconductor growth processes, such as chemical vapor deposition and plasma etching. We have been studying the spectroscopy and dynamics of such intermediates, in order to establish reliable data for experimental and theoretical attempts at optimizing industrial processes. We have succeeded in producing jet-cooled UV-visible spectra of SiF2, SiCl2, HSiF, HSiCl, HSiBr, GeH2, GeCl2, GeF2, HGeCl and HGeBr with resolution sufficient to resolve the vibrational and, in most cases, the rotational structure in the S1~-~S0 spectra. Analyses of these spectra have yielded the vibrational frequencies, rotational constants and sructures of the silylenes and germylenes, resolving a number of anomalies in the literature. The much weaker T1~-~S0 spectra of GeF2, GeCl2 and SiF2 have also been observed; in the SiF2 case we have obtained rotationally resolved spectra, triplet spin constants and a precise r0 structure. In other work relevant to SF6 low pressure plasma etching processes, we have detected the FS2 radical for the first time. The spin constants and structural parameters of the combining states were obtained from the rotational analysis of high-resolution jet spectra. Most recently, we have obtained spectra of the S2~-~S0 transition of silylidene, H2C=Si, and determined the ground and excited state structures and some of the vibrational frequencies. Silylidene has a variety of fascinating photophysical properties, including anomalous emission from the S2 state, rotational level specific quantum yields of fluorescence and extensive fluorescence quantum beats.